Browsing Department of Electrical Engineering by Author "Agrawal, Rakshit"
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Fabrication, Characterization And Hall Mobility Analysis Of MOS Devices With Low-k And High-k Dielectric Materials
Agrawal, Rakshit (Electrical Engineering, 2007-08-23)Scaling of MOSFETS has led to leakage current problems in SiO2 dielectric based MOSFETS. This has led to the introduction of high-k dielectric materials which can afford greater physical thickness and achieve the same ...