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Synthesis And Characterization Of Polythiophene Derivatives
(Materials Science & Engineering, 2007-10-08)
In Chapter 1, the history of conducting polymers, especially polythiophene and its derivatives, was briefly reviewed. Different approaches of structural modifications to afford small bandgap polythiophene derivatives were ...
Investigation On The Mechanism Of Interface Electromigration (EM) In Copper (Cu) Thin Films
(Materials Science & Engineering, 2007-08-23)
This study concerns the mechanism of the interface electromigration (EM) in copper (Cu) thin films. While EM in Cu is one of the most concerned reliability failure phenomena in Cu interconnects used microelectronic devices, ...
Thermal Failure Mechanism And Voltammetry Metrology For Cu/barrier/low K Integration
(Materials Science & Engineering, 2007-08-23)
The present study investigates the thermal stability of Cu/barrier/porous low κ (PLK) integration first, and then a new characterization method based on voltammetry is developed to characterize quality of diffusion ...